| The IMS 3f is a small radius magnetic sector ion microscope which can
be operated as a microprobe providing elemental abundance and isotope
analyses of a very small volume at the surface of solid sample.
The IMS 3f model established at NENIMF includes:
- Duoplasmatron ion source for generation of O- ions;
- Mass resolution power (M/ΔM) up to 8,000;
- SEM secondary ion counting system includes ETP Electron
Multipliers and ECL fast counting system from Pulse-Count Technology
Inc. and Faraday cup;
- Microchannel plate / Fluorescent screen detector for use as a secondary ion microscope;
- CCD camera mounted for secondary ion imaging;
- Improved peripheral electronics for better voltage stability
Last updated: August 14, 2009 |
